Equipment |Thin Film Characterization Equipment

Thin Film Characterization Equipment

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The importance of thin films is growing. Consequently, being able to accurately characterize properties of thin films is of the utmost importance. Properties such as film thickness, refractive index, transmission and reflection need to be measured.

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Equipment

Spectroscopic Ellipsometer for Film Thickness Measurement The SE200BA from Angstom Sun Technologies
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The Filmetrics® F54-XY-200 for Thickness Measurement
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In-Line Film Thickness Monitoring with Spectroscopic Reflectometer - Angstrom Sun Technologies
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$Filmetrics® F40: Measure Thickness and Refractive Index$
Filmetrics® F40: Measure Thickness and Refractive Index
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MSP100 Microspectrophotometer and Film Thickness Measurement System from Angstrom Sun Technologies
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Film Thickness Mapping Measurement System SRM100 from Angstrom Sun Technologies
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Electroluminescence Testing System for HB-LED Epiwafers - LumiMap from Bruker
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Spectroscopic Reflectometer and Film Thickness Measurement System SR300 from Angstrom Sun Technologies
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Filmetrics® F20 Thin-Film Analyzer: Accurate, Affordable, Reliable
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