Nanofilm Technologie GmbH
Nanofilm develops, manufactures, and distributes instruments & accessories for analysis and microscopy of surfaces in the field of material research, biochips, flat panel displays, Langmuir-Blodgett research, etc. Beginning in 1991 with the first commercial Brewster Angle Microscope, we have consistently expanded our line of novel instrumentation and accessories to various unique ellipsometers.
- An Ellipsometer is measuring thickness and refractive indexes.
- An Ellipsometer is used for detection of surface defects, inhomogenities, etc.
- An Ellipsometer with a high lateral resolutions are also able to measure on structured samples.