Posted in | Spectrometers

VERTEX 80/80v FTIR Spectrometer from Bruker

The VERTEX 80 and the VERTEX 80v vacuum FT-IR spectrometers from Bruker are based on the actively aligned UltraScan interferometer, which provide PEAK spectral resolution. The ultimate stability and sensitivity are guaranteed by the precise linear air bearing scanner and PEAK quality optics.

The VERTEX 80v is an evacuated optics bench capable of eliminating atmospheric moisture absorptions for ultimate stability and sensitivity; enabling demanding experiments such as UV spectral range measurements, step-scan, ultra fast rapidscan, or high resolution.

The VERTEX 80/80v optics design allows both PEAK instrument performance and PEAK flexibility. The unique Bruker Optics DigiTect technology allows easy and reproducible detector exchange by the instrument user, guarantees PEAK signal-to-noise ratio, and prevents external signal disturbance.

The two optional external detector ports accommodate the liquid He dewars of bolometer and/or hot electron detectors. Together with the external water cooled high power Hg-arc source, the recently rediscovered terahertz spectral range is accessible even with a room temperature operated DTGS-detector.

Spectral Range Extension

The VERTEX 80/80v can optionally be equipped with optical components to cover the spectral range from the far IR, or terahertz, through to the near and mid IR and visible, and up to the ultraviolet spectral range. Range change and maintenance are easy with its pre-aligned optical components and the actively aligned UltraScan interferometer.

BMS-c: The high-precision beamsplitter exchange option BMS-c for the VERTEX 80v vacuum spectrometer is provided by Bruker.

Thus, the remotely controlled automatic exchange of up to four different types of beamsplitters under vacuum conditions became possible. Now, it is possible to measure the complete spectral range from the UV/VIS to the far IR/THz without the need to vent the spectrometer optics bench for manual beamsplitter exchange.

NEW: Bruker has extended the existing range of beamsplitters with a new broad band far IR/THz beamsplitter for the VERTEX 80/80v FTIR spectrometer series.

Specifically for research and development of semiconducting and additional inorganic materials, the new far IR solid state beamsplitter will provide extra values as it covers nominally the spectral range from above 900 cm-1 to appr. 5 cm-1 in one measurement, and connects the mid IR with the very long wave FIR/THz wavelength ranges.

Optical Resolution

The VERTEX 80 and the VERTEX 80v standard configuration provides apodized spectral resolution of better than 0.2 cm-1, which is adequate for most ambient pressure gas phase studies and room temperature sample measurements. A PEAK resolution of better than 0.06 cm-1 is available for advanced low temperature work, e. g. on crystalline semiconductor materials or gas phase measurements at lower pressure.

This is the highest spectral resolution obtained using a commercial bench top FTIR spectrometer. A resolving power (wavenumber ν divided by spectral resolution ∆ν) of better 300,000:1 is demonstrated by high resolution spectra in the visible spectral range.


The innovative optics design results in the most expandable and flexible R&D vacuum FTIR spectrometer available. With the evacuated optics bench, PEAK sensitivity in the far-, mid- and near-IR regions is obtained without the fear of masking extremely weak spectral features by air water vapor absorptions.

Excellent results, e.g. in the area of nanoscience research down to less than 10-3 monolayers, can be acquired with the VERTEX 80v vacuum FTIR spectrometer. There are almost no limitations with respect to flexibility.

Five beam exit ports on the right, front and left side and two beam input ports on the right and rear side of the optics bench are available. This enables simultaneous connection of, for instance, a synchrotron light source using the rear side input port, the PMA 50 polarization modulation accessory at the right side exit beam, a fiber optics coupling at the right front side port, a bolometer detector at the left front, and the HYPERION series FTIR microscope at the left side exit beam.

BRAIN: Bruker Artificial Intelligence Network

FTIR spectroscopy is made to be reliable, fast and easy even for improved R&D experiments with a network of intelligent functions, such as recognition of sampling accessories (AAR) and optical components (ACR), automatic set-up and check of measurement parameters, and the permanent online checking (PerformanceGuard) of the spectrometer functionality.

The VERTEX 80 Series are ideal instruments for demanding research and development applications.

Technical Details

External Accessories, Sources and Detectors

The VERTEX 80/80v spectrometers are equipped with two beam input ports and five beam exit ports, and offer the possibility to connect them, for instance, to external laser and synchrotron light sources. The spectrometer optics can also be readily upgraded with external measurement accessories, detectors, and sources. This includes the following:

  • Auto sampler devices
  • Large integrating spheres
  • External emission adapter
  • Vacuum PL/PT/PR measurement unit
  • HYPERION series FTIR microscope
  • IMAC Focal Plane Array macro imaging accessory
  • External vacuum tight UHV chamber adaptation
  • HYPERION 3000 FTIR imaging system
  • PL II Photoluminescence module
  • External FIR Hg source
  • Solid State far IR/THz beamsplitter
  • Unique wide range MIR-FIR detector
  • Bolometer adaptation for detection in the FIR range
  • External high performance VIS source
  • Low temperature liquid He or cryogenic liquid free cryostats
  • External sample compartment XSA, evacuable or purgeable
  • TGA-FT-IR coupling
  • HTS-XT High Throughput Screening eXTension
  • External high performance MIR source
  • Automatic beamsplitter exchange unit (BMS-c) (for vacuum optics)
  • RAM II FT-Raman module and the RamanScope III FT-Raman microscope
  • PMA 50 Polarization Modulation Accessory for VCD and PM-IRRAS
  • Fiber optic coupling unit with MIR or NIR fiber probes for liquids and solids
  • External vacuum 4-position detector chamber (for vacuum optics)


The VERTEX 80 and VERTEX 80v spectrometers are the high-end research instruments in the VERTEX series. Their innovative optics design results in the most powerful bench top purge and vacuum spectrometers available. These spectrometers offer the broadest spectral range from the UV/VIS region (50000 cm-1) to the FIR/THz region (5 cm-1), an unmatched level of flexibility, and the highest spectral and temporal resolution.

The right solution for all high-end research applications is provided by the versatile VERTEX 80/80v systems together with their PEAK technology.

Research and Development

  • FTIR spectroelectrochemistry for the in-situ investigation of electrode surfaces and electrolytes
  • External adaptation of ultrahigh vacuum measurement chambers
  • Characterization of periodically ordered microscopic materials, called metamaterials
  • Instrumentation for vacuum FTIR beamline installations
  • Continuous and Step Scan technology for amplitude/phase modulation spectroscopy
  • Stopped-flow methods for enzyme catalysis experiments
  • High resolution spectroscopy for gas analysis with resolutions better than 0.06 cm-1
  • Rapid, interleaved and Step Scan technology for experiments with high temporal resolution (Step Scan/Rapid Scan/Interleaved TRS)


  • Differentiation of polymorphs of active pharmaceutical ingredients in the far infrared region
  • Characterization of stability and volatile content of medical drug products by thermal analysis (TGA-FTIR)
  • Determination of the absolute configuration of molecules (VCD)

Polymers and Chemistry

  • Identification of inorganic minerals and pigments
  • Reaction monitoring and reaction control (MIR fiber probe)
  • Dynamic and rheo-optical studies of polymers
  • Identification of inorganic fillers in polymer composites in the far infrared region
  • Determination of volatile compounds and characterization of decomposition processes by thermal analysis (TGA-FTIR)

Surface Analysis

  • Surface analysis combined with polarization modulation (PM-IRRAS)
  • Detection and characterization of thin and monolayers

Material Science

  • Investigation of dark materials and depth profiling by Photo-Acoustic Spectroscopy (PAS)
  • Characterization of optical and highly reflective materials (mirrors, windows)
  • Characterization of the emittance behavior of materials


  • Low temperature transmittance and photoluminescence (PL) measurements of shallow impurities for quality control
  • Determination of carbon and oxygen contents in silicon wafers

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